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ACTA AERONAUTICAET ASTRONAUTICA SINICA ›› 2018, Vol. 39 ›› Issue (6): 321971-321971.doi: 10.7527/S1000-6893.2018.21971

• Electronics and Electrical Engineering and Control • Previous Articles     Next Articles

Reliability modeling and analysis of DIMA system based on joint k/n(G) model

YAN Fang1,2,3, XING Peipei2,3, ZHAO Changxiao1,2,3, WANG Peng1,2,3   

  1. 1. Civil Aircraft Airworthiness and Repair Key Laboratory of Tianjin, Civil Aviation University of China, Tianjin 300300, China;
    2. Key Laboratory of Civil Aircraft Airworthiness Technology, Civil Aviation University of China, Tianjin 300300, China;
    3. School of Airworthiness, Civil Aviation University of China, Tianjin 300300, China
  • Received:2017-12-26 Revised:2018-03-01 Online:2018-06-15 Published:2018-03-01
  • Supported by:
    National Basic Research Program of China (2014CB744902); Joint Fund of the National Natural Science Foundation of China and the Civil Aviation Administration of China (U1533105)

Abstract: Considering the dynamic reconfiguration of the Distributed Integrated Modular Avionics (DIMA) system, the dynamic reconfiguration strategy and reconfiguration process are analyzed, and a joint k/n (G) reliability model for the DIMA system is constructed. An experimental analysis of the comprehensive display function residing in the DIMA system is carried out. The relationship between reliability and time of the system reconfiguration process is discussed, and the change of reliability curve is given using the general k/n (G) reliability model. Comparative analysis is conducted to show the applicability and rationality of the joint k/n (G) model. Through the parameter sensitivity analysis, the impact of different model configuration parameters on the system reliability is observed. The results can provide effective guidance for improving the reliability of the dynamic reconfiguration process of the DIMA system and optimizing resource allocation.

Key words: Distributed Integrated Modular Avionics (DIMA), dynamic reconfiguration, joint k/n (G) model, reliability, effectiveness, sensitivity

CLC Number: