航空学报 > 2013, Vol. 34 Issue (12): 2815-2822   doi: 10.7527/S1000-6893.2013.0332

电子装备多应力加速退化试验技术及可靠性评估方法研究

张国龙, 蔡金燕, 梁玉英, 潘刚, 李伟   

  1. 军械工程学院 电子与光学工程系, 河北 石家庄 050003
  • 收稿日期:2013-03-19 修回日期:2013-07-04 出版日期:2013-12-25 发布日期:2013-07-08
  • 通讯作者: 蔡金燕,Tel.:0311-87994289E-mail:caijinyan1961@163.com E-mail:caijinyan1961@163.com
  • 作者简介:张国龙男,博士研究生。主要研究方向:电子产品可靠性评估与加速性能退化试验研究。Tel:0311-87994235E-mail:zhang_20041987@163.com;蔡金燕女,博士,教授,博士生导师。主要研究方向:武器系统性能检测与故障诊断。Tel:0311-87994289E-mail:caijinyan1961@163.com
  • 基金资助:

    国家自然科学基金(61271153)

Research on Reliability Assessment Method of Electronic Equipment Based on Multi-stress ADT

ZHANG Guolong, CAI Jinyan, LIANG Yuying, PAN Gang, LI wei   

  1. Department of Electric and Optics Engineering, Ordnance Engineering College, Shijiazhuang 050003, China
  • Received:2013-03-19 Revised:2013-07-04 Online:2013-12-25 Published:2013-07-08

摘要:

针对电子装备在实际使用过程中其性能受多应力因素综合影响的特点,以某型雷达功能印制电路板(PCB)为试验对象,开展了温度-湿度-电应力综合加速退化试验(ADT)。通过试验分析了电子装备在多应力环境下的性能退化规律,分别就电源连续工作模式和通断模式下的加速退化数据进行建模及可靠性分析,验证了电源通断是影响电子产品可靠性的重要因素之一,并建立温度-湿度-电应力综合加速模型,解决了多应力加速试验数据建模难和分析复杂的难题。综合应力试验方法更加贴近装备的实际,加速性能退化的效果更加明显,能够提高试验效率和降低成本。

关键词: 电子装备, 多应力, 寿命, 加速退化试验, 加速模型, 可靠性评估

Abstract:

In order to deal with the performance degradation of electronic equipment affected by various environmental stresses in actual use, this paper conducts an accelerated degradation test (ADT) under the integrated stress of temperature-humidity-electricity with the printed circuit board (PCB) of a type of radar as experimental subject. It analyzes the general performance degradation trend of electronic equipment under multi-stress, models the degradation data and performed a reliability analysis of the test samples under power continuous and power on/off modes respectively. It also carries out a comparative analysis and verified the fact that power switching is an important factor for the reliability of electronic products. The paper establishes a multiple stress accelerated model which effectively solved the difficult problem of modeling and performing complex reliability assessment under multi-stress. The results show the accelerated test method under multi-stresses is more close to the environment of actual equipment use, and the effect of accelerated performance degradation is more obvious. Furthermore, this test method can also raise test efficiency and reduce cost.

Key words: electronic equipment, multi-stress, life, accelerated degradation test, accelerated model, reliability assessment

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