航空学报 > 2009, Vol. 30 Issue (5): 901-905

测试性研制阶段数据评估验证方法

石君友,田仲   

  1. 北京航空航天大学 工程系统工程系
  • 收稿日期:2008-03-07 修回日期:2008-07-10 出版日期:2009-05-25 发布日期:2009-05-25
  • 通讯作者: 石君友

Testability Verification Method Based on Data Evaluation in Development Phase

Shi Junyou, Tian Zhong   

  1. Department of System Engineering of Engineering Technology, Beijing University of Aeronautics  and Astronautics
  • Received:2008-03-07 Revised:2008-07-10 Online:2009-05-25 Published:2009-05-25
  • Contact: Shi Junyou

摘要:

分析了现有测试性验证方法应用情况,阐述了测试性研制阶段数据评估验证方法的必要性。通过与现有测试性验证方法的对比分析,提出了一种新的测试性验证方法,并说明了该验证方法的含义和特点。该验证方法可用于故障检测率、故障隔离率和虚警率的验证。建立了该验证方法的工作框架,包括验证要求、验证程序、验证技术和验证组织。重点阐述了该验证方法的两种工作方式实施流程、适用的最小样本量范围、测试性数据收集表格和测试性数据判据。其中,测试性数据收集表格可以记录故障检测、故障隔离和虚警信息。进行了案例应用,给出了数据分析结果和经验总结。案例应用表明该方法能够达到测试性验证的效果。

关键词: 测试性, 验证, 数据评估, 数据判据, 研制阶段, 样本量, 故障检测

Abstract:

The application of existing testability verification methods is analyzed,and the necessity of a testability verification method based on data evaluation in development phase is described. Based on a comparison with the existing testability verification methods, a new method is proposed, and the meanings and charactersistics of this method are enunciated. This method can be used to verify fault detection rate, fault isolation rate, and false alarm rate. The work frame of this verification method is established, which includes verification requirements, procedure, technique, and organization. The flow chart for the implementation of two work modes, the applicable range of minimum sample size, the tables for collecting testability data, and the testability data criteria for this verification method are described in detail. Information about fault detection, fault isolation, and false alarm can be recorded in the collection table of testability data. A case application is described. The data analysis results and conclusions drawn are provided. The case shows that this method can satisfy the requirements of testability verification.

Key words: testability, verification, data evaluation, data criterion, development phase, sample size, fault detection

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