Abstract:

For reliability analysis of implicit limit state function, an improved line sampling method is presented on the basis of sample simulation in the failure region. In the presented method, Markov chain is employed to simulate the samples located at the failure region, and the important direction of line sampling is obtained from these simulated samples. On the other hand, the simulated samples can be used as the samples for line sampling to evaluate the failure probability of implicit limit state function.

Key words: limit , state , function,  ,  , line , sampling,  ,  , Markov , chain,  ,  , failure , probability