一种基于ROM模型的测试性指标论证方法

doi:10.7527/S1000-6893.2020.24717

Abstract

Abstract: Aiming at the lack of theoretical and practical testability index demonstration method in practice, a novel method based on the ROM(operational readiness, reliability and maintainability) model is proposed. Starting from the relational expression of operational readiness (O), reliability (R) and maintainability (M), we establish the relations among Mean Time Between Failure (MTBF), Mean Time to Repair (MTTR) and fault diagnosis rate, false alarm rate and Built in Test (BIT) failure rate and substitute them into the "ROM" formula, obtaining the relation between the operational readiness and testability parameters. The relations between testability parameters and the number of BITs (number of BITs) are further established and substituted into the "ROM" formula to achieve the relation between operational readiness and number of BITs. The optimal number of BITs can be obtained from the curve of operational readiness and number of BITs, and the best testability index is derived subsequently. Considerable conclusions have been drawn from the simulation analysis of the availability curves, providing sufficient reference for different applications in setting parameters. Finally, photoelectric integrated equipment is used as a case to demonstrate the effectiveness of the ROM model and method.

Key words: design for testability, testability index, fault diagnosis rate, false alarm rate, Built in Test (BIT)

CLC Number:

TP806

YANG Peng, QIU Jing, LIU Guanjun, ZHANG Yong. Testability index determination method based on ROM model[J]. ACTA AERONAUTICAET ASTRONAUTICA SINICA, 2021, 42(12): 324717-324717.

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Testability index determination method based on ROM model

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