导航

ACTA AERONAUTICAET ASTRONAUTICA SINICA ›› 2006, Vol. 27 ›› Issue (2): 272-274.

• 论文 • Previous Articles     Next Articles

Selection and Analysis of Test Scheme Parameters for Time Curtailed Reliability Qualification Test

LI Gen-cheng, JIANG Tong-min   

  1. Department of System Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
  • Received:2004-11-11 Revised:2005-01-17 Online:2006-04-25 Published:2006-04-25

Abstract: Two time curtailed reliability qualification test design formulae and the rules about how to select the test scheme parameters are introduced, then the emphasis is put on the test result variance when different test schemes are selected.

Key words: reliability qualification test, time curtailed test, producer's risk, consumer's risk, minimum acceptance value, LQ scheme

CLC Number: