基于冷备份多模冗余结构的BRAM自修复方法

doi:10.7527/S1000-6893.2020.24676

电子电气工程与控制

本期目录 | 过刊浏览 | 高级检索

前一篇 | 后一篇

基于冷备份多模冗余结构的BRAM自修复方法

张砦, 刘燕, 黄莉莉

南京航空航天大学自动化学院, 南京 211106

收稿日期:2020-08-27 修回日期:2020-09-24 发布日期:2020-10-30
通讯作者: 张砦 E-mail:wolnyzhang@nuaa.edu.cn
基金资助:
中央高校基本科研业务费专项资金（NS2018026）；国家自然科学基金（61202001）；研究生创新基地（实验室）开放基金（kfjj20190316，kfjj20200319）

Self-repairing method for BRAM based on cold backup multi-mode redundancy structure

ZHANG Zhai, LIU Yan, HUANG Lili

College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China

Received:2020-08-27 Revised:2020-09-24 Published:2020-10-30
Supported by:
Fundamental Research Funds for the Central Universities (NS2018026); National Natural Science Foundation of China (61202001); Open Fund Project of Graduate Innovation Base (Laboratory) (kfjj20190316, kfjj20200319)

摘要/Abstract

摘要： 随着现场可编程门阵列（FPGA）在空天电子系统中的广泛应用，受空间辐射恶劣环境影响，FPGA中重要的存储器电路BRAM，因采用SRAM技术极易发生位翻转故障，虽绝大部分情况表现为瞬时故障，但永久故障依然存在。针对BRAM自修复方法仅修复瞬时故障的现状，对能同时修复瞬时故障和永久故障的自修复方法进行研究，提出了一种冷备份多模冗余结构，用3个热备份模块和1个冷备份模块来构造BRAM，该结构可通过三模冗余刷新方法修复瞬时故障和冷备份替换方法修复永久故障。给出了整个BRAM自修复系统中各模块的电路结构和实现方法，实验验证了系统的自修复能力，并在可靠性、硬件资源和时间消耗3个方面，通过对比分析论证了自修复方法的有效性。

关键词: BRAM, 冷备份, 自修复, 三模冗余刷新, 冷备份替换

Abstract: FPGAs have gained widespread application in the aerospace electronic system. Affected by the harsh radiation environment of the space, the important memory circuit BRAM in FPGAs is prone to bit flip failure due to the adoption of SRAM technology. Despite the large proportion of transient faults, permanent faults still exist. Since the current BRAM self-repairing methods address only transient faults, we study a self-repairing method that can simultaneously repair both transient and permanent faults. A cold backup multi-mode redundancy structure using three hot backup modules and one cold backup module to construct BRAM is proposed to repair transient faults through TMR-Scrubbing and permanent faults by cold-backup-replacement. The circuit structure and implementation method of each module in the entire BRAM self-repairing system have been presented, and the self-repairing ability of the system has been verified through experiments. The effectiveness of the method in terms of reliability, hardware resources and time consumption has been verified through comparative analysis.

Key words: BRAM, cold backup, self-repairing, TMR-Scrubbing, Cold-Backup-Replacement

中图分类号:

V443
V520.6

张砦, 刘燕, 黄莉莉. 基于冷备份多模冗余结构的BRAM自修复方法[J]. 航空学报, 2021, 42(7): 324676-324676.

ZHANG Zhai, LIU Yan, HUANG Lili. Self-repairing method for BRAM based on cold backup multi-mode redundancy structure[J]. ACTA AERONAUTICAET ASTRONAUTICA SINICA, 2021, 42(7): 324676-324676.

参考文献

[1] 张亚娟. 高性能FPGA中的BRAM模块设计[D]. 深圳:深圳大学, 2015:13-18. ZHANG Y J. The design of BRAM module in the high performance FPGA[D]. Shenzhen:Shenzhen University, 2015:13-18(in Chinese).
[2] 刘瑛, 胡凯, 丛红艳, 等. 一种FPGA中BRAM36k的设计方法[J]. 电子与封装, 2014, 14(5):18-22. LIU Y, HU K, CONG H Y, et al. A design method of FPGA BRAM36k[J]. Electronics & Packaging, 2014, 14(5):18-22(in Chinese).
[3] 袁晓军, 张亮. XILINX FPGA内部BRAM资源的应用研究[J]. 航空计算技术, 2018, 48(5):122-125. YUAN X J, ZHANG L. Application research on BRAM in XILINX FPGA[J]. Aeronautical Computing Technique, 2018, 48(5):122-125(in Chinese).
[4] 伊同超. 适用于纳米级可编程逻辑器件的BRAM设计与研究[D]. 哈尔滨:哈尔滨工业大学, 2014:8-12. YI T C. Design and research of BRAM applied to nano-scale field programmable gate array[D]. Harbin:Harbin Institute of Technology, 2014:8-12(in Chinese).
[5] 许海滨. FPGA软错误防护方法研究[D]. 西安:西安电子科技大学, 2015:14-17. XU H B. A study of FPGA protection methods for alleviating the influence of soft errors[D]. Xi'an:Xidian University, 2015:14-17(in Chinese).
[6] GLEIN R, MENGS P, RITTNER F, et al. BRAM implementation of a single-event upset sensor for adaptive single-event effect mitigation in reconfigurable FPGAs[C]//2017 NASA/ESA Conference on Adaptive Hardware and Systems (AHS). Piscataway:IEEE Press, 2017:1-8.
[7] RITTNER F, GLEIN R, HEUBERGER A. Detection and Isolation of permanent faults in FPGAs with remote access[C]//2016 International Conference on ReConFigurable Computing and FPGAs (ReConFig). Piscataway:IEEE Press, 2016:1-4.
[8] HONG C, BENKRID K, ITURBE X, et al. Design and implementation of fault-tolerant soft processors on FPGAs[C]//22nd International Conference on Field Programmable Logic and Applications (FPL). Piscataway:IEEE Press, 2012:683-686.
[9] LEONG C, SEMIÃO J, SANTOS M B, et al. Fast radiation monitoring in FPGA-based designs[C]//2015 Conference on Design of Circuits and Integrated Systems (DCIS). Piscataway:IEEE Press, 2015:1-6.
[10] BATISTA A J N, LEONG C, SANTOS B, et al. SEU mitigation exploratory tests in a ITER related FPGA[J]. Fusion Engineering and Design, 2017, 118:111-116.
[11] 丁朋程. 基于SRAM型FPGA的抗单粒子效应容错技术的研究[D]. 兰州:西北师范大学, 2013:43-52. DING P C. Research on fault-tolerance techniques against single event effects for SRAM-based FPGAs[D]. Lanzhou:Northwest Normal University, 2013:43-52(in Chinese).
[12] ROLLINS N, FULLER M, WIRTHLIN M J. A comparison of fault-tolerant memories in SRAM-based FPGAs[C]//2010 IEEE Aerospace Conference. Piscataway:IEEE Press, 2010:1-12.
[13] DE LIMA KASTENSMIDT F G, NEUBERGER G, HENTSCHKE R F, et al. Designing fault-tolerant techniques for SRAM-based FPGAs[J]. IEEE Design & Test of Computers, 2004, 21(6):552-562.
[14] MORGAN K S, MCMURTREY D L, PRATT B H, et al. A comparison of TMR with alternative fault-tolerant design techniques for FPGAs[J]. IEEE Transactions on Nuclear Science, 2007, 54(6):2065-2072.
[15] KELLER A M, WIRTHLIN M J. Benefits of complementary SEU mitigation for the LEON₃ soft processor on SRAM-based FPGAs[J]. IEEE Transactions on Nuclear Science, 2017, 64(1):519-528.
[16] 张砦, 王友仁. 基于可靠性优化的芯片自愈型硬件细胞阵列布局方法[J]. 航空学报, 2014, 35(12):3392-3402. ZHANG Z, WANG Y R. Method to reliability improvement of chip self-healing hardware by array layout reformation[J]. Acta Aeronautica et Astronautica Sinica, 2014, 35(12):3392-3402(in Chinese).
[17] 张砦, 王友仁. 应用设计过程的胚胎硬件细胞单元粒度优化方法[J]. 航空学报, 2016, 37(11):3502-3511. ZHANG Z, WANG Y R. Cell granularity optimization method of embryonics hardware in application design process[J]. Acta Aeronautica et Astronautica Sinica, 2016, 37(11):3502-3511(in Chinese).
[18] 杨士元. 数字系统的故障诊断与可靠性设计[M]. 北京:清华大学出版社, 2000:257-260. YANG S Y. Fault diagnosis and reliability design of digital system[M]. Beijing:Tsinghua University Press, 2000:257-260(in Chinese).
[19] ZHANG Z, QIU Y, YUAN X L, et al. A self-healing strategy with fault-cell reutilization of bio-inspired hardware[J]. Chinese Journal of Aeronautics, 2019, 32(7):1673-1683.
[20] 孙兆伟, 刘源, 徐国栋, 等. 基于FPGA内置RAM的抗辐射有限状态机设计[J]. 航空学报, 2010, 31(5):989-995. SUN Z W, LIU Y, XU G D, et al. Design of finite-state-machine for space application based on FPGA inner RAM[J]. Acta Aeronautica et Astronautica Sinica, 2010, 31(5):989-995(in Chinese).
[21] NIDHIN T S, BHATTACHARYYA A, BEHERA R P, et al. Dependable system design with soft error mitigation techniques in SRAM based FPGAs[C]//2017 Innovations in Power and Advanced Computing Technologies (i-PACT). Piscataway:IEEE Press, 2017:1-6.
[22] 伊小素, 邓燕, 潘雄, 等. BRAM存储器EDAC容错技术可靠性分析[J]. 航天控制, 2011, 29(5):67-71. YI X S, DENG Y, PAN X, et al. The BRAM reliability analysis with EDAC fault-tolerant technology[J]. Aerospace Control, 2011, 29(5):67-71(in Chinese).

E-mail：hkxb@buaa.edu.cn

关于我们

期刊社服务

专业学科

封面文章

友情链接

主管单位：中国科学技术协会主办单位：中国航空学会北京航空航天大学

基于冷备份多模冗余结构的BRAM自修复方法

Self-repairing method for BRAM based on cold backup multi-mode redundancy structure

RichHTML

PDF (PC)

可视化

摘要/Abstract

引用本文

使用本文

参考文献

相关文章 6

编辑推荐

Metrics

本文评价

[1]	王涛, 蔡金燕, 孟亚峰, 刘晓攀, 潘刚. 胚胎电子细胞阵列中空闲细胞的配置[J]. 航空学报, 2017, 38(4): 320266-320266.
[2]	陈海;王新民;赵凯瑞;李俨. 基于灰关联层次分析法的无人机自修复控制策略评价[J]. 航空学报, 2010, 31(5): 1030-1037.
[3]	柴干;胡寿松;王永. 歼击机自修复控制系统仿真研究[J]. 航空学报, 1999, 20(2): 122-126.
[4]	胡寿松;郭伟. 歼击机结构故障的检测与自修复控制律重构[J]. 航空学报, 1998, 19(6): 35-38.
[5]	陶宝祺;粱大开;熊克;袁慎芳. 形状记忆合金增强智能复合材料结构的自诊断、自修复功能的研究[J]. 航空学报, 1998, 19(2): 250-252.
[6]	李清;沈春林;郭锁凤. 自修复飞行控制系统舵面/作动器故障检测与隔离[J]. 航空学报, 1997, 18(6): 693-697.