Electronics and Electrical Engineering and Control

Foundation and assessment of testability growth model considering testability design limitation rectifying delay function

  • LI Tianmei ,
  • SI Xiaosheng ,
  • YANG Zonghao ,
  • XU Congqi ,
  • ZHANG Qi
Expand
  • 1. College of Missile Engineering, Rocket Force University of Engineering, Xi'an 710025, China;
    2. The PLA Rocket Force Academy, Qingzhou 262500, China;
    3. 32181 Force of PLA, Xi'an 710032, China

Received date: 2019-04-11

  Revised date: 2019-04-22

  Online published: 2019-06-24

Supported by

National Natural Science Foundation of China (61304103)

Abstract

For existing testability growth models ignores the rectifying process of testability design limitations, causes the testability growth process describes incompletely, and the tracking and projecting imprecise, a Testability Growth Model (TGM) which considers the rectifying delay based on Bell-shaped curve are proposed. Firstly, the mechanism relation between the discovering process of Testability Design Limitation (TDL) and the rectifying process of TDL is analyzed. And on the basis, three bell-shaped curves are used to describe the variation tendency of remaining testability design limitations, the three bell-shaped curves are Rayleigh curve and Delay-S curve, then, TGMs which consider bell-shaped TDL rectifying delay process are founded. Finally, a data set is used to verify the fitting, estimation and prediction of TGM. Result shows that:Gamma curve is more accurate to fit the number of Remaining Testability Design Limitation (RTDL) and that TGM considering the rectifying delay can give good result in fitting, estimation and prediction, and the accuracy of estimation can reach 10-2 order of magnitude.

Cite this article

LI Tianmei , SI Xiaosheng , YANG Zonghao , XU Congqi , ZHANG Qi . Foundation and assessment of testability growth model considering testability design limitation rectifying delay function[J]. ACTA AERONAUTICAET ASTRONAUTICA SINICA, 2019 , 40(9) : 323079 -323079 . DOI: 10.7527/S1000-6893.2019.23079

References

[1] 全国量和单位标准化技术委员会.装备测试大纲:GJB2547-1995[S].北京:中国标准出版社, 1995:68-108. National Technical Committee on Quantity and Unit Standardization. Testability program for materiel:GJB2547-1995[S]. Beijing:Standards Press of China, 1995:68-108(in Chinese).
[2] 田仲, 石君友.系统测试性设计分析与验证[M].北京:北京航空航天大学出版社,2003:361-396. TIAN Z, SHI J Y. Design,analysis and demonstration of system testability[M]. Beijing:Beihang University Press, 2003:361-396(in Chinese).
[3] LI T M, XU C Q, QIU J, et al. The assessment and foundation of bell-shaped testability growth effort functions dependent system testability growth models based on NHPP[J]. Mathematical Problems in Engineering, 2015,27(1):1-18.
[4] ZHAO C X, QIU J, LIU G J, et al. A testability growth model and its application[C]//IEEE Autotestcon. Piscataway, NJ:IEEE Press, 2014:121-128.
[5] ZHAO C X, KRISHINA P, LIU G J, et al. A Markov Chain-based testability growth model with a cost-benefit function[J]. IEEE Transactions on Systems, Man and Cybernetics:Systems, 2016, 46(4):524-534.
[6] SCHNEIDEWIND N. Modeling the fault correction process[C]//Proceddings of the 12th International Conference on Software Reliability Engineering, 2001:185-190.
[7] PHAM H, ZHANG X M. NHPP software reliability and cost models with testing coverage[J].European Journal of Operational Research, 2003, 145(6):443-454.
[8] 舒艳君. 故障检测与修正过程的NHPP类软件可靠性增长模型研究[D].哈尔滨:哈尔滨工业大学, 2009:50-102. SHU Y J. Research on NHPP software reliability growth models of fault detection and correction processes[D]. Harbin:Harbin Institute of Technology, 2009:50-102(in Chinese).
[9] PHAM H, NORDMANN L, ZHANG X M. A general imperfect software debugging model with s-shaped fault-detection rate[J]. IEEE Transaction on Power Systems, 1999, 48(2):169-176.
[10] LI Q Y, LI H F, LU M Y, et al. Software reliability growth model with s-shaped testing effort function[J]. Journal of Beijing University of Aeronautics and Astronautics, 2011,37(2):149-160.
[11] PHAM H, ZHANG X M. NHPP software reliability and cost models with testing coverage[J].European Journal of Operational Research, 2003, 145(8):443-454.
[12] PHAM H. Software reliability and cost models:Perspectives, comparison and practice[J]. European Journal of Operational Research, 2003,149(6):475-489.
[13] PENG R, LI Y F, ZHANG W J, et al. Testing effort dependent software reliability model for imperfect debugging considering both detection and correction[J].Reliability Engineering and System Safety,2014, 126(4):37-43.
[14] KAPUR P K, PHAM H, GUPTA A, et al. Software reliability assessment with applications[M]. London:Springer-Verlag, 2011:315-386.
[15] HUANG C, LIN C. Software reliability analysis by considering fault dependency and debugging time lag[J]. IEEE Transaction on Reliability, 2006, 55(3):436-450.
Outlines

/