Abstract: To solve the fault prediction problems of missile electronic equipment, a new method about fault based on combined environmental accelerated degradation testing (ADT) and particle filter is presented in this paper. First, unlike the traditional ADT project, the proposed testing uses one single sample. Based on the idea of step-up-stress acceleration, the performance degradation theory is extended to accelerated performance degradation theory(APDT). An accelerated life span degradation model is proposed based on electron life span degradation speed. Then, to minimize the effect of unstable environmental stress and other uncertain factors, the electron degradation degree is defined. The uncertainties in life prediction are transformed into optimal estimation problems, and the particle filter algorithm is used to solve the optimal estimation value of electronic product dynamic damage. Finally, an example is given to show the feasibility and validity of the proposed method, by which higher ratio of cost efficiency is achieved.

Key words: fault prediction, accelerated degradation testing, life evaluation, particle filter, electronic equipment