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New Index for Reliability Sensitivity Analysis Under Epistemic Uncertainty
SUO Bin, ZENG Chao, CHENG Yongsheng, LI Shiling
ACTA AERONAUTICAET ASTRONAUTICA SINICA . 2013, (7): 1605 -1615 .  DOI: 10.7527/S1000-6893.2013.0224

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All copyright © editorial office of Chinese Journal of Aeronautics

Total visits: 6658907 Today visits: 1341