航天器介质盘环结构内带电特性三维仿真分析

原青云; 王松; 黄欣鑫

doi:10.7527/S1000-6893.2019.23035

航空学报 >

2019 , Vol. 40 >Issue 9: 323035 - 323035

DOI: https://doi.org/10.7527/S1000-6893.2019.23035

电子电气工程与控制

航天器介质盘环结构内带电特性三维仿真分析

原青云 ,
王松 ,
黄欣鑫

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1. 陆军工程大学电磁环境效应国家级重点实验室, 石家庄 050003;
2. 63618部队, 库尔勒 841000

收稿日期: 2019-03-29

修回日期: 2019-04-17

网络出版日期: 2019-05-07

基金资助

国家自然科学基金（51577190）；电磁环境效应重点实验室基金（614220501020117）

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3-D simulation of internal dielectric charging characteristics of spacecraft dielectric disc structure

YUAN Qingyun ,
WANG Song ,
HUANG Xinxin

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1. National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University of PLA, Shijiazhuang 050003, China;
2. Unit 63618, Kuerle 841000, China

Received date: 2019-03-29

Revised date: 2019-04-17

Online published: 2019-05-07

Supported by

National Natural Science Foundation of China (51577190); National Key Laboratory on Electromagnetic Environment Effects Foundation (614220501020117)

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摘要

针对航天器内特定结构的内带电（IDC）问题，以航天器典型复杂介质结构——太阳帆板驱动机构介质盘环为研究对象，开展了地球同步轨道恶劣充电环境（Flumic3）下介质内带电三维仿真分析。通过Geant4实现电荷输运模拟，根据电荷守恒定律数值计算得到电场，在此基础上，研究了屏蔽厚度对介质内带电的影响规律，提出了根据屏蔽厚度调整入射电子能谱能量下限以提高计算效率的方法。仿真结果表明，盘环结构内带电最严重部位是盘环最外圈上层介质与金属导电环接触的上边沿；增加屏蔽厚度可以减缓充电风险，但是随着温度降低，屏蔽效果会随之减弱。在地球同步轨道恶劣充电环境（Flumic3）下，当温度低至183 K时，由于辐射诱导电导率成为总电导率的主导部分，从而增大屏蔽的同时也会降低介质电导率，导致即使3 mm铝屏蔽下仍可能出现接近10⁷ V/m的场强峰值。

关键词： 航天器; 介质内带电; 三维仿真; 介质盘环结构; 屏蔽厚度

本文引用格式

原青云 , 王松 , 黄欣鑫 . 航天器介质盘环结构内带电特性三维仿真分析[J]. 航空学报, 2019 , 40(9) : 323035 -323035 . DOI: 10.7527/S1000-6893.2019.23035

Abstract

For the Internal Dielectric Charging (IDC) of a particular spacecraft structure, in this paper, a 3-D IDC simulation is performed to a typical spacecraft complex dielectric structure——Solar Array Drive Mechanism (SADM) disc——considering the Geostationary Earth Orbit (GEO) with severe radiation environment (Flumic3). A charge transportation simulation is carried out by Geant4 and the electric field is numerically computed according to the charge conservation law. Based on those, the effects of shielding thickness on internal dielectric charging is studied, and a technique is proposed to improve the simulation efficiency by adjusting the lower energy limit of the incident electron spectrum according to the shielding thickness. The simulation results show that the most serious internal charging position occurs on the top edge of the contact face between the outermost upper layer dielectric of the disc structure and the metallic conducting ring. The increment of the shielding thickness could mitigate IDC. However, this mitigation effect is weaker as the temperature is falling. In the GEO with severe radiation environment (Flumic3), at temperature of 183 K, since the radiation-induced conductivity dominates the total conductivity, the dielectric conductivity will be cut down as the shielding thickness is increased. In this case, even using a 3 mm aluminum shielding, the peak electric field can reach the level of 10⁷V/m.

Key words： spacecraft; internal dielectric charging; 3-D simulation; dielectric disc structure; shielding thickness

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