电子装备多应力加速退化试验技术及可靠性评估方法研究
收稿日期: 2013-03-19
修回日期: 2013-07-04
网络出版日期: 2013-07-08
基金资助
国家自然科学基金（61271153）
Research on Reliability Assessment Method of Electronic Equipment Based on Multi-stress ADT
Received date: 2013-03-19
Revised date: 2013-07-04
Online published: 2013-07-08
张国龙 , 蔡金燕 , 梁玉英 , 潘刚 , 李伟 . 电子装备多应力加速退化试验技术及可靠性评估方法研究[J]. 航空学报, 2013 , 34(12) : 2815 -2822 . DOI: 10.7527/S1000-6893.2013.0332
In order to deal with the performance degradation of electronic equipment affected by various environmental stresses in actual use, this paper conducts an accelerated degradation test (ADT) under the integrated stress of temperature-humidity-electricity with the printed circuit board (PCB) of a type of radar as experimental subject. It analyzes the general performance degradation trend of electronic equipment under multi-stress, models the degradation data and performed a reliability analysis of the test samples under power continuous and power on/off modes respectively. It also carries out a comparative analysis and verified the fact that power switching is an important factor for the reliability of electronic products. The paper establishes a multiple stress accelerated model which effectively solved the difficult problem of modeling and performing complex reliability assessment under multi-stress. The results show the accelerated test method under multi-stresses is more close to the environment of actual equipment use, and the effect of accelerated performance degradation is more obvious. Furthermore, this test method can also raise test efficiency and reduce cost.
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